14 results
Latency Dose Formation In DMC By Inelastic Electron Scattering
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2216-2217
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- August 2022
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Coherence and Inelastic Scattering in Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2762-2763
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- August 2022
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Measurement of Grain Boundary Properties in Cu(ln,Ga)Se2 Thin Films
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- Journal:
- Microscopy Today / Volume 26 / Issue 3 / May 2018
- Published online by Cambridge University Press:
- 08 May 2018, pp. 32-39
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- May 2018
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Image Analysis Optimization for Quantifying Nanoparticle Dispersions in Polymer-based Nanocomposites Using Transmission Electron Microscopy (TEM)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1312 / 2011
- Published online by Cambridge University Press:
- 04 February 2011, mrsf10-1312-ii11-11
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- 2011
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Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 130-131
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- July 2010
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The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 122-123
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- July 2010
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Performance of a Silicon-Drift Detector in 200kV TEM Environments
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 228-229
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- July 2009
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Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1088-1089
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- July 2009
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Towards a Quantitative Understanding in Electron Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 602-603
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- July 2009
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Analysis of Catalysts using Aberration-Corrected TEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1390-1391
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- August 2008
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Electron Tomography for Analysis of Catalysts
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1074-1075
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- August 2008
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Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 874-875
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- August 2003
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Interface structure of a YBa2Cu3O7−x/N/YBa2Cu3O7−x superconductor/normal metal/superconductor Josephson junction using YBa2Cu2.79Co0.21O7−x as the normal barrier N
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- Journal:
- Journal of Materials Research / Volume 11 / Issue 2 / February 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 281-287
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- February 1996
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